高灵敏、高分辨二次离子探针质谱计(SHRIMP)--中国地质科学院地质所
仪器简介:
The Sensitive High Resolution Ion Micro Probe (SHRIMP) IIe is a high precision Secondary Ion Mass Spectrometer (SIMS). Ion microprobes make in situ isotopic and chemical 'surface' analysis of solid targets by bombarding the sample with an ion beam with a diameter of several microns typically employing Kohler focussing. The high mass resolution of SHRIMP IIe is achieved by the use of double-focussing mass spectrometer (simultaneous energy and mass refocussing) with a very large turning radius of Magnet and Electrostatic Analyser. SHRIMP has many applications: zircon dating in copper-uranium-gold-silver deposits, uranium-lead dating of sulphur in the sulphide minerals that form metal ores, the isotopic composition of sulphur in the giant base metal ore bodies. With the addition of an optional cesium gun rather than the standard duoplasmatron, the SHRIMP IIe excels in the analysis of oxygen. Analysis of non-conductive samples is assisted with the optional electron gun for charge neutralisation.主要应用领域:
Geochronology/Stable Isotopes/Trace Elements设备照片:
仪器的主要特性:
二次离子以90°出射,限定了分馏效应; 三阶四极杆离子透镜,保证了最大的离子传输系数; 1272mm大半径静电分析器 1000mm大半径离子轨道磁场,获得了高质量色散 可旋转入口缝,宽度5-150mm可调 聚焦系统操作简便,性能良好 高稳定,低磁滞效应的电磁场;分辨本领:5000 (1%) 灵 敏 度:206Pb-27 cps/ppm; 精 度:对标准锆石SL13 206Pb/238U年龄误差小于1%。设备基本信息:
